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28-十月-2014Advanced Cu chemical displacement technique for SiO2-based electrochemical metallization ReRAM applicationChin, Fun-Tat; Lin, Yu-Hsien; You, Hsin-Chiang; Yang, Wen-Luh; Lin, Li-Min; Hsiao, Yu-Ping; Ko, Chum-Min; Chao, Tien-Sheng; 電子物理學系; Department of Electrophysics
2013Estimating the Detection Stability of a Si Nanowire Sensor Using an Additional Charging ElectrodeChen, Min-Cheng; Chen, Hsiao-Chien; Lee, Ta-Hsien; Lin, Yu-Hsien; Shih, Jyun-Hung; Wang, Bo-Wei; Hou, Yun-Fang; Chen, Yi-Ju; Lin, Chia-Yi; Lin, Chang-Hsien; Hsieh, Yi-Ping; Ho, ChiaHua; Hua, Mu-Yi; Qiu, Jian-Tai; Wang, Tahui; Yang, Fu-Liang; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-五月-2017Experimental Realization of Thermal Stability Enhancement of Nickel Germanide Alloy by Using TiN Metal CappingChou, Chen-Han; Tsai, Yi-He; Hsu, Chung-Chun; Jau, Yu-Hau; Lin, Yu-Hsien; Yeh, Wen-Kuan; Chien, Chao-Hsin; 材料科學與工程學系; 電子工程學系及電子研究所; Department of Materials Science and Engineering; Department of Electronics Engineering and Institute of Electronics
1-二月-2013HfO2 nanocrystal memory on SiGe channelLin, Yu-Hsien; Chien, Chao-Hsin; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-十月-2013High-Performance Double-Layer Nickel Nanocrystal Memory by Ion Bombardment TechniqueLiu, Sheng-Hsien; Yang, Wen-Luh; Lin, Yu-Hsien; Wu, Chi-Chang; Chao, Tien-Sheng; 電子物理學系; Department of Electrophysics
1-一月-2016High-Performance Schottky Contact Quantum-Well Germanium Channel pMOSFET With Low Thermal Budget ProcessHsu, Chung-Chun; Tsai, Yi-He; Chen, Che-Wei; Li, Jyun-Han; Lin, Yu-Hsien; Lee, Yao-Jen; Luo, Guang-Li; Chien, Chao-Hsin; 材料科學與工程學系; 電子工程學系及電子研究所; Department of Materials Science and Engineering; Department of Electronics Engineering and Institute of Electronics
1-四月-2007Impact of channel dangling bonds on reliability characteristics of flash memory on poly-Si thin filmsLin, Yu-Hsien; Chien, Chao-Hsin; Chou, Tung-Huan; Chao, Tien-Sheng; Lei, Tan-Fu; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
十一月-2016Improving Thermal Stability and Interface State Density of High-kappa Stacks by Incorporating Hf into an Interfacial Layer on p-GermaniumTsai, Yi-He; Chou, Chen-Han; Shih, An-Shih; Jau, Yu-Hau; Yeh, Wen-Kuan; Lin, Yu-Hsien; Ko, Fu-Hsiang; Chien, Chao-Hsin; 材料科學與工程學系; 材料科學與工程學系奈米科技碩博班; 電子工程學系及電子研究所; Department of Materials Science and Engineering; Graduate Program of Nanotechnology , Department of Materials Science and Engineering; Department of Electronics Engineering and Institute of Electronics
1-九月-2014Ion-Bombarded and Plasma-Passivated Charge Storage Layer for SONOS-Type Nonvolatile MemoryLiu, Sheng-Hsien; Wu, Chi-Chang; Yang, Wen-Luh; Lin, Yu-Hsien; Chao, Tien-Sheng; 電子物理學系; Department of Electrophysics
1-三月-2007Low-temperature polycrystalline silicon thin-film flash memory with hafnium silicateLin, Yu-Hsien; Chien, Chao-Hsin; Chou, Tung-Huan; Chao, Tien-Sheng; Lei, Tan-Fu; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-十一月-2015Microwave Annealing for NiSiGe Schottky Junction on SiGe P-ChannelLin, Yu-Hsien; Tsai, Yi-He; Hsu, Chung-Chun; Luo, Guang-Li; Lee, Yao-Jen; Chien, Chao-Hsin; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-三月-2012Nanoscale 2-Bit/Cell HfO2 Nanocrystal Flash MemoryLin, Yu-Hsien; Chien, Chao-Hsin; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-十一月-2013Novel Ion Bombardment Technique for Doping Limited Cu Source in SiOx-Based Nonvolatile Switching LayerLiu, Sheng-Hsien; Yang, Wen-Luh; Lin, Yu-Hsien; Wu, Chi-Chang; Chao, Tien-Sheng; 電子物理學系; Department of Electrophysics
1-一月-2015Switching characteristics in Cu:SiO2 by chemical soak methods for resistive random access memory (ReRAM)Chin, Fun-Tat; Lin, Yu-Hsien; Yang, Wen-Luh; Liao, Chin-Hsuan; Lin, Li-Min; Hsiao, Yu-Ping; Chao, Tien-Sheng; 電子物理學系; Department of Electrophysics
2007Two-bit lanthanum oxide trapping layer nonvolatile flash memoryLin, Yu-Hsien; Chien, Chao-Hsin; Yang, Tsung-Yuan; Lei, Tan-Fu; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-一月-2012Two-bit/four-level Pr2O3 trapping layer for silicon-oxide-nitride-oxide-silicon-type flash memoryLin, Yu-Hsien; You, Hsin-Chiang; Chien, Chao-Hsin; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2009利用混沌序列模擬樹的樣態林育賢; Lin, Yu-Hsien; 張書銘; Chang, Shu-Ming; 應用數學系數學建模與科學計算碩士班