Browsing by Author Li, Yiming

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Issue DateTitleAuthor(s)
201016奈米場效應電晶體特性擾動抑制暨TFT-LCD驅動電路設計優化之研究李國輔; Lee, Kuo-Fu; 李義明; Li, Yiming; 電信工程研究所
20052005 international symposium of computational electronics: Physical modeling, mathematical theory, and numerical algorithmLi, Yiming; 電信工程研究所; Institute of Communications Engineering
20092008 International Symposium on Computational Management and Social ScienceLi, Yiming; 電信工程研究所; Institute of Communications Engineering
1-Apr-20102008 International Workshop on Scientific Computing in Electronics Engineering (WSCEE 2008) PrefaceLi, Yiming; Dyshlovenko, Pavel; Ezaki, Tatsuya; Fjeldly, Tor A.; Kosina, Hans; 電機工程學系; Department of Electrical and Computer Engineering
May-201632-nm Multigate Si-nTFET With Microwave-Annealed Abrupt JunctionHou, Fu-Ju; Sung, Po-Jung; Hsueh, Fu-Kuo; Wu, Chien-Ting; Lee, Yao-Jen; Chang, Mao-Nang; Li, Yiming; Hou, Tuo-Hung; 電機學院; 電子工程學系及電子研究所; College of Electrical and Computer Engineering; Department of Electronics Engineering and Institute of Electronics
20093D 65nm CMOS with 320 degrees C Microwave Dopant ActivationLee, Yao-Jen; Lu, Yu-Lun; Hsueh, Fu-Kuo; Huang, Kuo-Chin; Wan, Chia-Chen; Cheng, Tz-Yen; Han, Ming-Hung; Kowalski, Jeff M.; Kowalski, Jeff E.; Heh, Dawei; Chuang, Hsi-Ta; Li, Yiming; Chao, Tien-Sheng; Wu, Ching-Yi; Yang, Fu-Liang; 電子物理學系; 電子工程學系及電子研究所; 電信工程研究所; Department of Electrophysics; Department of Electronics Engineering and Institute of Electronics; Institute of Communications Engineering
20103D Device Simulation of Work Function and Interface Trap Fluctuations on High-kappa/Metal Gate DevicesCheng, Hui-Wen; Li, Fu-Hai; Han, Ming-Hung; Yiu, Chun-Yen; Yu, Chia-Hui; Lee, Kuo-Fu; Li, Yiming; 傳播研究所; Institute of Communication Studies
201250% Efficiency Intermediate Band Solar Cell Design Using Highly Periodical Silicon Nanodisk ArrayHu, Weiguo; Igarashi, Makoto; Lee, Ming-Yi; Li, Yiming; Samukawa, Seiji; 電機工程學系; Department of Electrical and Computer Engineering
1-Apr-2008Analysis of field emission of fabricated nanogap in Pd strips for surface conduction electron-emitter displaysLo, Hsiang-Yu; Li, Yiming; Tsai, Chih-Hao; Pan, Fu-Ming; 材料科學與工程學系; 電信工程研究所; Department of Materials Science and Engineering; Institute of Communications Engineering
1-Mar-2018Analysis of In-Line Process Parameters of the Unity Gain Frequency of HKMG Bulk FinFET DevicesSu, Ping-Hsun; Li, Yiming; 電機工程學系; Department of Electrical and Computer Engineering
1-Jul-2007Analytical solution of nonlinear Poisson equation for symmetric double-gate metal-oxide-semiconductor field effect transistorsLo, Shih-Ching; Li, Yiming; Yu, Shao-Ming; 資訊工程學系; 電信工程研究所; Department of Computer Science; Institute of Communications Engineering
1-Feb-2012Application of Block Diagonal Technique to a Hamiltonian Matrix in Performing Spin-splitting Calculations for GaN Wurtzite MaterialsChen, Chun-Nan; Chang, Sheng-Hsiung; Su, Wei-Long; Wang, Wan-Tsang; Kao, Hsiu-Fen; Jen, Jen-Yi; Li, Yiming; 電信工程研究所; Institute of Communications Engineering
1-Jan-2017Asymmetric Characteristic Fluctuation of Undoped Gate-All-Around Nanowire MOSFETs Induced by Random Discrete Dopants inside Source/Drain ExtensionsSung, Wen-Li; Li, Yiming; 資訊工程學系; 電機工程學系; 電信工程研究所; Department of Computer Science; Department of Electrical and Computer Engineering; Institute of Communications Engineering
1-Apr-2010Asymmetric gate capacitance and dynamic characteristic fluctuations in 16 nm bulk MOSFETs due to random distribution of discrete dopantsLee, Kuo-Fu; Li, Yiming; Hwang, Chih-Hong; 傳播研究所; 電機工程學系; Institute of Communication Studies; Department of Electrical and Computer Engineering
1-Apr-2010Asymmetric gate capacitance and dynamic characteristic fluctuations in 16 nm bulk MOSFETs due to random distribution of discrete dopantsLee, Kuo-Fu; Li, Yiming; Hwang, Chih-Hong; 電子工程學系及電子研究所; 電信工程研究所; Department of Electronics Engineering and Institute of Electronics; Institute of Communications Engineering
2008Asymmetric Gate Capacitance and High Frequency Characteristic Fluctuations in 16 nm Bulk MOSFETs Due to Random Distribution of Discrete DopantsLi, Yiming; Hwang, Chih-Hong; Yeh, Ta-Ching; 電信工程研究所; Institute of Communications Engineering
1-Mar-2019Atomic layer germanium etching for 3D Fin-FET using chlorine neutral beamOhori, Daisuke; Fujii, Takuya; Noda, Shuichi; Mizubayashi, Wataru; Endo, Kazuhiko; Lee, En-Tzu; Li, Yiming; Lee, Yao-Jen; Ozaki, Takuya; Samukawa, Seiji; 交大名義發表; 電機工程學系; National Chiao Tung University; Department of Electrical and Computer Engineering
2007Automatic generation of passive equivalent circuits for broadband microstrip antennasKuo, Yi-Ting; Chao, Hsueh-Yung (Robert); Li, Yiming; 電信工程研究所; Institute of Communications Engineering
1-Feb-2007An automatic parameter extraction technique for advanced CMOS device modeling using genetic algorithmLi, Yiming; 電信工程研究所; Institute of Communications Engineering
3-Apr-2015Capacitance Characteristic Optimization of Germanium MOSFETs with Aluminum Oxide by Using a Semiconductor-Device-Simulation-Based Multi-Objective Evolutionary Algorithm MethodLi, Yiming; Chen, Chieh-Yang; 傳播研究所; 電機資訊學士班; Institute of Communication Studies; Undergraduate Honors Program of Electrical Engineering and Computer Science