Browsing by Author Huang, Shih-Che

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Showing results 1 to 18 of 18
Issue DateTitleAuthor(s)
2007Analysis of P-type poly-Si TFT degradation under dynamic gate voltage stress using the slicing modelHuang, Shih-Che; Tsao, Hung-Chuan; Tai, Ya-Hsiang; 光電工程學系; Department of Photonics
1-Dec-2006Analysis of poly-Si TFT degradation under gate pulse stress using the slicing modelTai, Ya-Hsiang; Huang, Shih-Che; Chen, Chien-Kwen; 光電工程學系; 顯示科技研究所; Department of Photonics; Institute of Display
2007Capacitance-voltage behaviors of the LTPS TFTs before and after DC stress explained by the slicing modelKuo, Yan-Fu; Huang, Shih-Che; Chao, Yu-Te; Tai, Ya-Hsiang; 光電工程學系; Department of Photonics
2008Characterization of device degradation of poly-Si TFTs under dynamic operation with drain biasedTai, Ya-Hsiang; Huang, Shih-Che; Chan, Chang-Lung; 光電工程學系; Department of Photonics
1-Aug-2008Characterization of poly-Si TFT variation using interdigitated methodHuang, Shih-Che; Tai, Ya-Hsiang; 光電工程學系; 顯示科技研究所; Department of Photonics; Institute of Display
1-Mar-2010Characterization of the Channel-Shortening Effect on P-Type Poly-Si TFTsTai, Ya-Hsiang; Huang, Shih-Che; Chen, Po-Ting; 光電工程學系; 顯示科技研究所; Department of Photonics; Institute of Display
1-Mar-2009Degradation Mechanism of Poly-Si TFTs Dynamically Operated in OFF RegionTai, Ya-Hsiang; Huang, Shih-Che; Chen, Po-Ting; 光電工程學系; 顯示科技研究所; Department of Photonics; Institute of Display
2007Degradation of the capacitance-voltage behaviors of the low-temperature polysilicon TFTs under DC stressTai, Ya-Hsiang; Huang, Shih-Che; Lin, Chien Wen; Chiu, Hao Lin; 光電工程學系; 顯示科技研究所; Department of Photonics; Institute of Display
2007Dynamic stress effects on the reliability of poly-Si TFTKuo, Yan-Fu; Huang, Shih-Che; Shih, Wei-Lun; Tai, Ya-Hsiang; 光電工程學系; Department of Photonics
2007Estimation of the effect of channel shortening for P-type poly-Si TFTs under AC stressHuang, Shih-Che; Tsao, Hung-Chuan; Tai, Ya-Hsiang; 光電工程學系; Department of Photonics
1-Mar-2011Generalized Hot-Carrier Degradation and Its Mechanism in Poly-Si TFTs Under DC/AC OperationsTai, Ya-Hsiang; Huang, Shih-Che; Chen, Po-Ting; Lin, Chih-Jung; 光電工程學系; 顯示科技研究所; Department of Photonics; Institute of Display
1-Aug-2008The Linear Combination Model for the Degradation of Amorphous Silicon Thin Film Transistors under Drain AC StressTai, Ya Hsiang; Tsai, Ming-Hsien; Huang, Shih-Che; 工學院; 光電工程學系; 顯示科技研究所; College of Engineering; Department of Photonics; Institute of Display
1-Dec-2007A statistical model for simulating the effect of UPS TFT device variation for SOP applicationsTai, Ya-Hsiang; Huang, Shih-Che; Chen, Wan-Ping; Chao, Yu-Te; Chou, Yen-Pang; Peng, Guo-Feng; 光電工程學系; 顯示科技研究所; Department of Photonics; Institute of Display
25-Nov-2006Statistical study on the states in the low-temperature poly-silicon films with thin film transistorsHuang, Shih-Che; Chou, Yen-Pang; Tai, Ya-Hsiang; 光電工程學系; 顯示科技研究所; Department of Photonics; Institute of Display
25-Nov-2006Study on electrical degradation of p-type low-temperature polycrystalline silicon thin film transistors with C-V measurement analysisHuang, Shih-Che; Kao, Yu-Han; Tai, Ya-Hsiang; 光電工程學系; 顯示科技研究所; Department of Photonics; Institute of Display
1-May-2008Variation and mismatch effects of the low-temperature poly-Si TFTs on the circuit for the X-ray active matrix sensorTai, Ya-Hsiang; Huang, Shih-Che; Su, Ko-Ching; Tseng, Chen-Yeh; 顯示科技研究所; Institute of Display
2013以有機金屬化學氣相沉積於碳化矽基板上成長氮化鋁鎵/氮化鎵異質結構之高電子遷移率電晶體的應用黃士哲; Huang, Shih-Che; 張翼; Chang, Edward Yi; 材料科學與工程學系所
2008多晶矽薄膜電晶體的空間與時間變動性探討黃士哲; Huang, Shih-Che; 戴亞翔; Tai, Ya-Hsiang; 光電工程學系