瀏覽 的方式: 作者 Chen, Jwu E.

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公開日期標題作者
1-十一月-2006IEEE standard 1500 compatible interconnect diagnosis for delay and crosstalk faultsLi, Katherine Shu-Min; Su, Chauchin; Chang, Yao-Wen; Lee, Chung-Len; Chen, Jwu E.; 電控工程研究所; Institute of Electrical and Control Engineering
1-八月-2007IEEE standard 1500 compatible oscillation ring test methodology for interconnect delay and crosstalk detectionLi, Katherine Shu-Min; Lee, Chung-Len; Su, Chauchin; Chen, Jwu E.; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2006A multilayer data copy scheme for low cost test with controlled scan-in power for multiple scan chain designsLin, Shih Ping; Lee, Chung Len; Chen, Jwu E.; Chen, Ji-Jan; Luo, Kun-Lun; Wu, Wen-Ching; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-九月-2007Multilevel full-chip routing with testability and yield enhancementLi, Katherine Shu-Min; Chang, Yao-Wen; Lee, Chung-Len; Sul, Chauchin; Chen, Jwu E.; 交大名義發表; 電控工程研究所; National Chiao Tung University; Institute of Electrical and Control Engineering
2005Oscillation ring based interconnect test scheme for SOCLi, Katherine Shu-Min; Lee, Chung Len; Su, Chauchin; Chen, Jwu E.; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-二月-2009A Unified Detection Scheme for Crosstalk Effects in Interconnection BusLi, Katherine Shu-Min; Lee, Chung-Len; Su, Chauchin; Chen, Jwu E.; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics