Browsing by Author Chen, Chieh-Yang

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Showing results 1 to 19 of 19
Issue DateTitleAuthor(s)
3-Apr-2015Capacitance Characteristic Optimization of Germanium MOSFETs with Aluminum Oxide by Using a Semiconductor-Device-Simulation-Based Multi-Objective Evolutionary Algorithm MethodLi, Yiming; Chen, Chieh-Yang; 傳播研究所; 電機資訊學士班; Institute of Communication Studies; Undergraduate Honors Program of Electrical Engineering and Computer Science
1-May-2019Characteristic Fluctuations of Dynamic Power Delay Induced by Random Nanosized Titanium Nitride Grains and the Aspect Ratio Effect of Gate-All-Around Nanowire CMOS Devices and CircuitsLi, Yiming; Chen, Chieh-Yang; Chuang, Min-Hui; Chao, Pei-Jung; 電機工程學系; Department of Electrical and Computer Engineering
1-Jan-2015Circuit-Simulation-Based Multi-objective Evolutionary Algorithm with Multi-Level Clock Driving Technique for a-Si:H TFTs Gate Driver Circuit Design OptimizationHung, Sheng-Chin; Chen, Chieh-Yang; Chiang, Chien-Hsueh; Li, Yiming; 分子醫學與生物工程研究所; 電機工程學系; 電信工程研究所; Institute of Molecular Medicine and Bioengineering; Department of Electrical and Computer Engineering; Institute of Communications Engineering
3-Jul-2013Device Simulation-Based Multiobjective Evolutionary Algorithm for Process Optimization of Semiconductor Solar CellsLi, Yiming; Chen, Yu-Yu; Chen, Chieh-Yang; Shen, Cheng-Han; Cheng, Hui-Wen; Lo, I-Hsiu; Chen, Chun-Nan; 資訊工程學系; Department of Computer Science
2015Electrical Characteristic and Power Consumption Fluctuations of Trapezoidal Bulk FinFET Devices and Circuits Induced by Random Line Edge RoughnessChen, Chieh-Yang; Huang, Wen-Tsung; Li, Yiming; 資訊工程學系; Department of Computer Science
2013Experimentally Effective Clean Process to C-V Characteristic Variation Reduction of HKMG MOS DevicesChen, Chien-Hung; Li, Yiming; Chen, Chieh-Yang; Chen, Yu-Yu; Hsu, Sheng-Chia; Huang, Wen-Tsung; Chu, Sheng-Yuan; 電機工程學系; Department of Electrical and Computer Engineering
21-Dec-2016Lateral amorphous selenium metal-insulator-semiconductor-insulator-metal photodetectors using ultrathin dielectric blocking layers for dark current suppressionChang, Cheng-Yi; Pan, Fu-Ming; Lin, Jian-Siang; Yu, Tung-Yuan; Li, Yi-Ming; Chen, Chieh-Yang; 材料科學與工程學系; 電機工程學系; Department of Materials Science and Engineering; Department of Electrical and Computer Engineering
1-Sep-2013Mobility model extraction for surface roughness of SiGe along (110) and (100) Orientations in HKMG bulk FinFET devicesChen, Chien-Hung; Li, Yiming; Chen, Chieh-Yang; Chen, Yu-Yu; Hsu, Sheng-Chia; Huang, Wen-Tsung; Chu, Sheng-Yuan; 資訊工程學系; Department of Computer Science
2012Multi-Objective Display Panel Design Optimization using Circuit Simulation-Based Evolutionary AlgorithmChen, Yu-Yu; Li, Yiming; Chen, Chieh-Yang; Chiang, Chien-Hshueh; 傳播研究所; Institute of Communication Studies
1-Jan-2013On Characteristic Variability of 16-nm-Gate Bulk FinFET Devices Induced by Intrinsic Parameter Fluctuation and Process Variation EffectChen, Chieh-Yang; Li, Yiming; Chen, Yu-Yu; Chang, Han-Tung; Hsu, Sheng-Chia; Huang, Wen-Tsung; Yang, Chin-Min; Chen, Li-Wen; 資訊工程學系; Department of Computer Science
2012On Statistical Variation of MOSFETs Induced by Random-Discrete-Dopants and Random-Interface-TrapsLi, Yiming; Su, Hsin-Wen; Chen, Chieh-Yang; Cheng, Hui-Wen; Chen, Yu-Yu; Chang, Han-Tung; 資訊工程學系; Department of Computer Science
2015Process Variation Effect, Metal-Gate Work-Function Fluctuation and Random Dopant Fluctuation of 10-nm Gate-All-Around Silicon Nanowire MOSFET DevicesLi, Yiming; Chang, Han-Tung; Lai, Chun-Ning; Chao, Pei-Jung; Chen, Chieh-Yang; 交大名義發表; 傳播研究所; 分子醫學與生物工程研究所; 電機學院; National Chiao Tung University; Institute of Communication Studies; Institute of Molecular Medicine and Bioengineering; College of Electrical and Computer Engineering
2012Random Work Function Induced DC Characteristic Fluctuation in 16-nm High-kappa/Metal Gate Bulk and SOI FinFETsSu, Hsin-Wen; Chen, Yu-Yu; Chen, Chieh-Yang; Cheng, Hui-Wen; Chang, Han-Tung; Li, Yiming; 電機工程學系; Department of Electrical and Computer Engineering
1-Jan-2014Random-work-function-induced characteristic fluctuation in 16-nm-gate bulk and SOI FinFETsLi, Yiming; Chen, Chieh-Yang; Chen, Yu-Yu; 資訊工程學系; Department of Computer Science
2016Statistical Device Simulation of Characteristic Fluctuation of 10-nm Gate-All-Around Silicon Nanowire MOSFETs Induced by Various Discrete Random DopantsSung, Wen-Li; Chang, Han-Tung; Chen, Chieh-Yang; Chao, Pei-Jung; Li, Yiming; 分子醫學與生物工程研究所; 電機工程學系; 電信工程研究所; Institute of Molecular Medicine and Bioengineering; Department of Electrical and Computer Engineering; Institute of Communications Engineering
1-Jan-2013Statistical Device Simulation of Intrinsic Parameter Fluctuation in 16-nm-Gate N- and P-type Bulk FinFETsChen, Yu-Yu; Huang, Wen-Tsung; Hsu, Sheng-Chia; Chang, Han-Tung; Chen, Chieh-Yang; Yang, Chin-Min; Chen, Li-Wen; Li, Yiming; 資訊工程學系; Department of Computer Science
1-Jan-2015Upper/lower-side random dopant fluctuation on 16-nm-gate HKMG bulk FinFETLi, Yiming; Huang, Wen-Tsung; Chen, Chieh-Yang; Chen, Yu-Yu; 資訊工程學系; Department of Computer Science
1-Jan-2017Work Function Modulation of Monolayer MoS2 Doped with 3d Transition MetalsTsai, Yi-Chia; Chen, Chieh-Yang; Ho, Min-Shao; Li, Yiming; 電機工程學系; Department of Electrical and Computer Engineering
2013以多目標演化技術實現矽薄膜太陽能電池結構設計最佳化之研究陳頡陽; Chen, Chieh-Yang; 李義明; Li, Yiming; 電信工程研究所