Browsing by Author Chang, Ting-Chang

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Issue DateTitleAuthor(s)
1-Mar-2017Abnormal Dual Channel Formation Induced by Hydrogen Diffusion From SiNx Interlayer Dielectric in Top Gate a-InGaZnO TransistorsChen, Guan-Fu; Chang, Ting-Chang; Chen, Hua-Mao; Chen, Bo-Wei; Chen, Hong-Chih; Li, Cheng-Ya; Tai, Ya-Hsiang; Hung, Yu-Ju; Chang, Kuo-Jui; Cheng, Kai-Chung; Huang, Chen-Shuo; Chen, Kuo-Kuang; Lu, Hsueh-Hsing; Lin, Yu-Hsin; 交大-IBM智慧物聯網與巨量資料分析研發中心
9-Jan-2017Abnormal hump in capacitance-voltage measurements induced by ultraviolet light in a-IGZO thin-film transistorsTsao, Yu-Ching; Chang, Ting-Chang; Chen, Hua-Mao; Chen, Bo-Wei; Chiang, Hsiao-Cheng; Chen, Guan-Fu; Chien, Yu-Chieh; Tai, Ya-Hsiang; Hung, Yu-Ju; Huang, Shin-Ping; Yang, Chung-Yi; Chou, Wu-Ching; 電子物理學系; 光電工程學系; Department of Electrophysics; Department of Photonics
24-Sep-2012Abnormal interface state generation under positive bias stress in TiN/HfO2 p-channel metal-oxide-semiconductor field effect transistorsLo, Wen-Hung; Chang, Ting-Chang; Tsai, Jyun-Yu; Dai, Chih-Hao; Chen, Ching-En; Ho, Szu-Han; Chen, Hua-Mao; Cheng, Osbert; Huang, Cheng-Tung; 電子工程學系及電子研究所; 光電工程學系; Department of Electronics Engineering and Institute of Electronics; Department of Photonics
8-Jul-2013Abnormal sub-threshold swing degradation under dynamic hot carrier stress in HfO2/TiN n-channel metal-oxide-semiconductor field-effect-transistorsTsai, Jyun-Yu; Chang, Ting-Chang; Lo, Wen-Hung; Chen, Ching-En; Ho, Szu-Han; Chen, Hua-Mao; Tai, Ya-Hsiang; Cheng, Osbert; Huang, Cheng-Tung; 電子工程學系及電子研究所; 光電工程學系; Department of Electronics Engineering and Institute of Electronics; Department of Photonics
1-Apr-2012Abnormal Subthreshold Leakage Current at High Temperature in InGaZnO Thin-Film TransistorsChang, Geng-Wei; Chang, Ting-Chang; Jhu, Jhe-Ciou; Tsai, Tsung-Ming; Syu, Yong-En; Chang, Kuan-Chang; Tai, Ya-Hsiang; Jian, Fu-Yen; Hung, Ya-Chi; 光電工程學系; Department of Photonics
1-Dec-2014Abnormal temperature-dependent floating-body effect on Hot-Carrier Degradation in PDSOI n-MOSFETsLiu, Kuan-Ju; Chang, Ting-Chang; Yang, Ren-Ya; Chen, Ching-En; Ho, Szu-Han; Tsai, Jyun-Yu; Hsieh, Tien-Yu; Cheng, Osbert; Huang, Cheng-Tung; 電機工程學系; Department of Electrical and Computer Engineering
28-Sep-2013Abnormal threshold voltage shift under hot carrier stress in Ti1-xNx/HfO2 p-channel metal-oxide-semiconductor field-effect transistorsTsai, Jyun-Yu; Chang, Ting-Chang; Lo, Wen-Hung; Ho, Szu-Han; Chen, Ching-En; Chen, Hua-Mao; Tseng, Tseung-Yuen; Tai, Ya-Hsiang; Cheng, Osbert; Huang, Cheng-Tung; 電子工程學系及電子研究所; 光電工程學系; Department of Electronics Engineering and Institute of Electronics; Department of Photonics
2016Abnormal Transconductance Enhancement under Positive Bias Stress in Nanoscale n-Channel Fin Field-Effect-TransistorsLiu, Kuan-Ju; Chang, Ting-Chang; Lin, Chien-Yu; Chen, Ching-En; Tsai, Jyun-Yu; Lu, Ying-Hsin; Liu, Hsi-Wen; Cheng, Osbert; Huang, Cheng-Tung; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
Oct-2016Adjustable built-in resistor on oxygen-vacancy-rich electrode-capped resistance random access memoryPan, Chih-Hung; Chang, Ting-Chang; Tsai, Tsung-Ming; Chang, Kuan-Chang; Chu, Tian-Jian; Chen, Po-Hsun; Chen, Min-Chen; Sze, Simon M.; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
31-Dec-2017Analysis of abnormal transconductance in body-tied partially-depleted silicon-on-insulator n-MOSFETsLin, Chien-Yu; Chang, Ting-Chang; Liu, Kuan-Ju; Chen, Li-Hui; Chen, Ching-En; Tsai, Jyun-Yu; Liu, Hsi-Wen; Lu, Ying-Hsin; Liao, Jin-Chien; Ciou, Fong-Min; Lin, Yu-Shan; 電機學院; College of Electrical and Computer Engineering
1-Jan-1970Analysis of an anomalous hump in gate current after dynamic negative bias stress in HfxZr1-xO2/metal gate p-channel metal-oxide-semiconductor field-effect transistorsHo, Szu-Han; Chang, Ting-Chang; Wu, Chi-Wei; Lo, Wen-Hung; Chen, Ching-En; Tsai, Jyun-Yu; Luo, Hung-Ping; Tseng, Tseung-Yuen; Cheng, Osbert; Huang, Cheng-Tung; Sze, Simon M.; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2010Analysis of Anomalous Capacitance Induced by TAGIDL in p-Channel LTPS TFTsLin, Chia-Sheng; Chen, Ying-Chung; Chang, Ting-Chang; Li, Hung-Wei; Chen, Shih-Ching; Jian, Fu-Yen; Chuang, Ying-Shao; Chen, Te-Chih; Chen, Yu-Chun; Tai, Ya-Hsiang; 光電工程學系; 顯示科技研究所; Department of Photonics; Institute of Display
3-Dec-2012Analysis of anomalous traps measured by charge pumping technique in HfO2/metal gate n-channel metal-oxide-semiconductor field-effect transistorsHo, Szu-Han; Chang, Ting-Chang; Lu, Ying-shin; Lo, Wen-Hung; Chen, Ching-En; Tsai, Jyun-Yu; Chen, Hua-Mao; Wu, Chi-Wei; Luo, Hung-Ping; Liu, Guan-Ru; Tseng, Tseung-Yuen; Cheng, Osbert; Huang, Cheng-Tung; Sze, Simon M.; 電子工程學系及電子研究所; 光電工程學系; Department of Electronics Engineering and Institute of Electronics; Department of Photonics
1-Jun-2017Analysis of Contrasting Degradation Behaviors in Channel and Drift Regions Under Hot Carrier Stress in PDSOI LD N-Channel MOSFETsLin, Chien-Yu; Chang, Ting-Chang; Liu, Kuan-Ju; Chen, Li-Hui; Tsai, Jyun-Yu; Chen, Ching-En; Lu, Ying-Hsin; Liu, Hsi-Wen; Liao, Jin-Chien; Chang, Kuan-Chang; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-Dec-2010Analysis of Degradation Mechanism in SONOS-TFT Under Hot-Carrier OperationChen, Te-Chih; Chang, Ting-Chang; Chen, Shih-Ching; Hsieh, Tien-Yu; Jian, Fu-Yen; Lin, Chia-Sheng; Li, Hung-Wei; Lee, Ming-Hsien; Chen, Jim-Shone; Shih, Ching-Chieh; 光電工程學系; Department of Photonics
2013Analysis of Electrical Characteristics and Reliability Change of Zinc-Tin-Oxide Thin-Film Transistors by Photo-Thermal TreatmentChen, Yu-Chun; Chang, Ting-Chang; Li, Hung-Wei; Chung, Wan-Fang; Hsieh, Tien-Yu; 電子工程學系及電子研究所; 光電工程學系; Department of Electronics Engineering and Institute of Electronics; Department of Photonics
Apr-2016Analysis of Oxide Trap Characteristics by Random Telegraph Signals in nMOSFETs With HfO2-Based Gate DielectricsChen, Ching-En; Chang, Ting-Chang; You, Bo; Tsai, Jyun-Yu; Lo, Wen-Hung; Ho, Szu-Han; Liu, Kuan-Ju; Lu, Ying-Hsin; Liu, Xi-Wen; Hung, Yu-Ju; Tseng, Tseung-Yuen; Cheng, Osbert; Huang, Cheng-Tung; Lu, Ching-Sen; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-Nov-2009Anomalous Capacitance Induced by GIDL in P-Channel LTPS TFTsLin, Chia-Sheng; Chen, Ying-Chung; Chang, Ting-Chang; Chen, Shih-Ching; Jian, Fu-Yen; Li, Hung-Wei; Chen, Te-Chih; Weng, Chi-Feng; Lu, Jin; Hsu, Wei-Che; 光電工程學系; Department of Photonics
2013Anomalous Gate Current Hump after Dynamic Negative Bias Stress and Negative-Bias Temperature-Instability in p-MOSFETs with HfxZr1-xO2 and HfO2/Metal Gate StacksHo, Szu-Han; Chang, Ting-Chang; Wu, Chi-Wei; Lo, Wen-Hung; Chen, Ching-En; Tsai, Jyun-Yu; Chen, Hua-Mao; Liu, Guan-Ru; Tseng, Tseung-Yuen; Cheng, Osbert; Huang, Cheng-Tung; Chen, Daniel; Sze, Simon M.; 電子工程學系及電子研究所; 光電工程學系; Department of Electronics Engineering and Institute of Electronics; Department of Photonics
21-Mar-2011Anomalous on-current and subthreshold swing improvement in low-temperature polycrystalline-silicon thin-film transistors under Gate bias stressLin, Chia-Sheng; Chen, Ying-Chung; Chang, Ting-Chang; Jian, Fu-Yen; Li, Hung-Wei; Chen, Yi-Chuan; Chen, Te-Chih; Tai, Ya-Hsiang; 電子工程學系及電子研究所; 光電工程學系; 顯示科技研究所; Department of Electronics Engineering and Institute of Electronics; Department of Photonics; Institute of Display