Browsing by Author Wu, JW

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Showing results 3 to 13 of 13 < previous 
Issue DateTitleAuthor(s)
1-Dec-1995Effects of rapid thermal annealing on Si delta-doped GaInP grown by low pressure metalorganic chemical vapor depositionWang, CJ; Feng, MS; Chan, SH; Wu, JW; Chang, CY; Sze, SM; 材料科學與工程學系; 電控工程研究所; Department of Materials Science and Engineering; Institute of Electrical and Control Engineering
1-Apr-1996Excellent Au/Ge/Pd ohmic contacts to n-type GaAs using Mo/Ti as the diffusion barrierChai, CY; Huang, JA; Lai, YL; Wu, JW; Chang, CY; Chan, YJ; Cheng, HC; 電子工程學系及電子研究所; 奈米中心; Department of Electronics Engineering and Institute of Electronics; Nano Facility Center
1-Sep-2005Excess low-frequency noise in ultrathin oxide n-MOSFETs arising from valence-band electron tunnelingWu, JW; You, JW; Ma, HC; Cheng, CC; Hsu, CF; Chang, CS; Huang, GW; Wang, TH; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-Nov-1998Heat transfer in open cell polyurethane foam insulationWu, JW; Chu, HS; 機械工程學系; Department of Mechanical Engineering
29-Aug-2002High power Al0.3Ga0.7As/In0.2Ga0.8As enhancement-mode PHEMT for low-voltage wireless communication systemsChen, SH; Chang, L; Chang, EY; Wu, JW; Chang, CY; 材料科學與工程學系; 電子工程學系及電子研究所; 友訊交大聯合研發中心; Department of Materials Science and Engineering; Department of Electronics Engineering and Institute of Electronics; D Link NCTU Joint Res Ctr
1-Apr-1996High-performance An/Ti/Ge/Pd ohmic contacts on n-Type In0.5Ga0.5PChai, CY; Wu, JW; Guo, JD; Huang, JA; Lai, YL; Chan, SH; Chang, CY; Chan, YJ; Cheng, HC; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2004Hot carrier degradation in LDMOS power transistorsCheng, CC; Wu, JW; Lee, CC; Shao, JH; Wang, T; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2005Low frequency noise degradation in ultra-thin oxide (I5A) analog n-MOSFETs resulting from valence-band tunnelingWu, JW; You, JW; Ma, HC; Cheng, CC; Hsu, C; Huang, GW; Chang, CS; Wang, T; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-Aug-2004Pocket implantation effect on drain current flicker noise in analog nMOSFET devicesWu, JW; Cheng, CC; Chiu, KL; Guo, JC; Lien, WY; Chang, CS; Huang, GW; Wang, TH; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-Jun-1999Thermal conductivity of polyurethane foamsWu, JW; Sung, WF; Chu, HS; 機械工程學系; Department of Mechanical Engineering
22-Nov-2004Valence-band tunneling induced low frequency noise in ultrathin oxide (15 angstrom) n-type metal-oxide-semiconductor field effect transistorsWu, JW; You, JW; Ma, HC; Cheng, CC; Chang, CS; Huang, GW; Wang, T; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics