Browsing by Author Lee, Yao-Jen

Jump to: 0-9 A B C D E F G H I J K L M N O P Q R S T U V W X Y Z
or enter first few letters:  
Showing results 1 to 20 of 78  next >
Issue DateTitleAuthor(s)
16-Sep-20131/f noise in micrometer-sized ultrathin indium tin oxide filmsYeh, Sheng-Shiuan; Hsu, Wei-Ming; Lee, Jui-Kan; Lee, Yao-Jen; Lin, Juhn-Jong; 電子物理學系; 物理研究所; Department of Electrophysics; Institute of Physics
May-201632-nm Multigate Si-nTFET With Microwave-Annealed Abrupt JunctionHou, Fu-Ju; Sung, Po-Jung; Hsueh, Fu-Kuo; Wu, Chien-Ting; Lee, Yao-Jen; Chang, Mao-Nang; Li, Yiming; Hou, Tuo-Hung; 電機學院; 電子工程學系及電子研究所; College of Electrical and Computer Engineering; Department of Electronics Engineering and Institute of Electronics
20093D 65nm CMOS with 320 degrees C Microwave Dopant ActivationLee, Yao-Jen; Lu, Yu-Lun; Hsueh, Fu-Kuo; Huang, Kuo-Chin; Wan, Chia-Chen; Cheng, Tz-Yen; Han, Ming-Hung; Kowalski, Jeff M.; Kowalski, Jeff E.; Heh, Dawei; Chuang, Hsi-Ta; Li, Yiming; Chao, Tien-Sheng; Wu, Ching-Yi; Yang, Fu-Liang; 電子物理學系; 電子工程學系及電子研究所; 電信工程研究所; Department of Electrophysics; Department of Electronics Engineering and Institute of Electronics; Institute of Communications Engineering
1-Jan-20133D Vertical TaOx/TiO2 RRAM with over 10(3) Self-Rectifying Ratio and Sub-mu A Operating CurrentHsu, Chung-Wei; Wan, Chia-Chen; Wang, I-Ting; Chen, Mei-Chin; Lo, Chun-Li; Lee, Yao-Jen; Jang, Wen-Yueh; Lin, Chen-Hsi; Hou, Tuo-Hung; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-Jul-2011Amorphous-Layer Regrowth and Activation of P and As Implanted Si by Low-Temperature Microwave AnnealingHsueh, Fu-Kuo; Lee, Yao-Jen; Lin, Kun-Lin; Current, Michael I.; Wu, Ching-Yi; Chao, Tien-Sheng; 電子物理學系; Department of Electrophysics
1-Mar-2019Atomic layer germanium etching for 3D Fin-FET using chlorine neutral beamOhori, Daisuke; Fujii, Takuya; Noda, Shuichi; Mizubayashi, Wataru; Endo, Kazuhiko; Lee, En-Tzu; Li, Yiming; Lee, Yao-Jen; Ozaki, Takuya; Samukawa, Seiji; 交大名義發表; 電機工程學系; National Chiao Tung University; Department of Electrical and Computer Engineering
2014Characterization of Ultra-Thin Ni Silicide Film by Two-Step Low Temperature Microwave AnnealWu, Chien-Ting; Lee, Yao-Jen; Hsueh, Fu-Kuo; Sung, Po-Jung; Cho, Ta-Chun; Current, Michael Ira; Chao, Tien-Sheng; 電子物理學系; Department of Electrophysics
1-Apr-2010A comparison of plasma-induced damage on the reliability between high-k/metal-gate and SiO(2)/poly-gate complementary metal oxide semiconductor technologyWeng, Wu-Te; Lee, Yao-Jen; Lin, Horng-Chih; Huang, Tiao-Yuan; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-Apr-2010A comparison of plasma-induced damage on the reliability between high-k/metal-gate and SiO2/poly-gate complementary metal oxide semiconductor technologyWeng, Wu-Te; Lee, Yao-Jen; Lin, Horng-Chih; Huang, Tiao-Yuan; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2007Comparisons on performance improvement by nitride capping layer among different channel directions nMOSFETsTsai, Tzu-, I; Lee, Yao-Jen; Chen, King-Sheng; Wang, Jeff; Hsueh, Fu-Kuo; Lin, Horng-Chih; Huang, Tiao-Yuan; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2009A Comprehensive Study of Ge1-xSix on Ge for the Ge nMOSFETs with Tensile Stress, Shallow Junctions and Reduced LeakageLuo, Guang-Li; Huang, Shih-Chiang; Chung, Cheng-Ting; Heh, Dawei; Chien, Chao-Hsin; Cheng, Chao-Ching; Lee, Yao-Jen; Wu, Wen-Fa; Hsu, Chiung-Chih; Kuo, Mei-Ling; Yao, Jay-Yi; Chang, Mao-Nan; Liu, Chee-Wee; Hu, Chenming; Chang, Chun-Yen; Yang, Fu-Liang; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2015Diamond-shaped Ge and Ge0.9Si0.1 Gate-All-Around Nanowire FETs with Four {111} Facets by Dry Etch TechnologyLee, Yao-Jen; Hou, Fu-Ju; Chuang, Shang-Shiun; Hsueh, Fu-Kuo; Kao, Kuo-Hsing; Sung, Po-Jung; Yuan, Wei-You; Yao, Jay-Yi; Lu, Yu-Chi; Lin, Kun-Lin; Wu, Chien-Ting; Chen, Hisu-Chih; Chen, Bo-Yuan; Huang, Guo-Wei; Chen, Henry J. H.; Li, Jiun-Yun; Li, Yiming; Samukawa, Seiji; Chao, Tien-Sheng; Tseng, Tseung-Yuen; Wu, Wen-Fa; Hou, Tuo-Hung; Yeh, Wen-Kuan; 電子物理學系; 電機學院; 電子工程學系及電子研究所; Department of Electrophysics; College of Electrical and Computer Engineering; Department of Electronics Engineering and Institute of Electronics
1-Feb-2011Dopant Activation in Single-Crystalline Germanium by Low-Temperature Microwave AnnealingLee, Yao-Jen; Chuang, Shang-Shiun; Hsueh, Fu-Kuo; Lin, Ho-Ming; Wu, Shich-Chuang; Wu, Ching-Yi; Tseng, Tseung-Yuen; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
24-Sep-2012Effects of microwave annealing on electrical enhancement of amorphous oxide semiconductor thin film transistorTeng, Li-Feng; Liu, Po-Tsun; Lo, Yuan-Jou; Lee, Yao-Jen; 光電學院; 光電工程學系; 顯示科技研究所; College of Photonics; Department of Photonics; Institute of Display
1-Sep-2013Effects of Microwave Annealing on Nitrogenated Amorphous In-Ga-Zn-O Thin-Film Transistor for Low Thermal Budget Process ApplicationFuh, Chur-Shyang; Liu, Po-Tsun; Teng, Li-Feng; Huang, Sih-Wei; Lee, Yao-Jen; Shieh, Han-Ping D.; Sze, Simon M.; 電子工程學系及電子研究所; 光電工程學系; 顯示科技研究所; Department of Electronics Engineering and Institute of Electronics; Department of Photonics; Institute of Display
1-Aug-2009Effects of Plasma Damage on Metal-insulator-Metal Capacitors and Transistors for Advanced Mixed-Signal/Radio-Frequency Metal-Oxide-Semiconductor Field-Effect Transistor TechnologyWeng, Wu-Te; Lee, Yao-Jen; Lin, Hong-Chih; Huang, Tiao-Yuan; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
15-Apr-2011Electrode dependence of filament formation in HfO(2) resistive-switching memoryLin, Kuan-Liang; Hou, Tuo-Hung; Shieh, Jiann; Lin, Jun-Hung; Chou, Cheng-Tung; Lee, Yao-Jen; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
15-Apr-2011Electrode dependence of filament formation in HfO2 resistive-switching memoryLin, Kuan-Liang; Hou, Tuo-Hung; Shieh, Jiann; Lin, Jun-Hung; Chou, Cheng-Tung; Lee, Yao-Jen; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
7-Mar-2011Evolution of RESET current and filament morphology in low-power HfO(2) unipolar resistive switching memoryHou, Tuo-Hung; Lin, Kuan-Liang; Shieh, Jiann; Lin, Jun-Hung; Chou, Cheng-Tung; Lee, Yao-Jen; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
7-Mar-2011Evolution of RESET current and filament morphology in low-power HfO2 unipolar resistive switching memoryHou, Tuo-Hung; Lin, Kuan-Liang; Shieh, Jiann; Lin, Jun-Hung; Chou, Cheng-Tung; Lee, Yao-Jen; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics