Browsing by Author LEE, CL

Jump to: 0-9 A B C D E F G H I J K L M N O P Q R S T U V W X Y Z
or enter first few letters:  
Showing results 3 to 22 of 93 < previous   next >
Issue DateTitleAuthor(s)
1-Sep-1993BINARY PARTITION ALGORITHMS AND VLSI ARCHITECTURES FOR MEDIAN AND RANK ORDER FILTERINGLEE, CL; JEN, CW; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-Feb-1992BIT-SLICED MEDIAN FILTER DESIGN BASED ON MAJORITY GATELEE, CL; JEN, CW; 交大名義發表; 電控工程研究所; National Chiao Tung University; Institute of Electrical and Control Engineering
1979CF4 PLASMA-ETCHING ON LINBO3LEE, CL; LU, CL; 交大名義發表; 電控工程研究所; National Chiao Tung University; Institute of Electrical and Control Engineering
1-Oct-1993CHARACTERISTICS OF POLYSILICON CONTACTED SHALLOW JUNCTION DIODE FORMED WITH A STACKED-AMORPHOUS-SILICON FILMWU, SL; LEE, CL; LEI, TF; CHANG, HC; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-Dec-1995CHARACTERISTICS OF TOP-GATE THIN-FILM TRANSISTORS FABRICATED ON NITROGEN-IMPLANTED POLYSILICON FILMSYANG, CK; LEI, TF; LEE, CL; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-Sep-1993CHARACTERIZATION OF SEMIINSULATING POLYCRYSTALLINE SILICON PREPARED BY LOW-PRESSURE CHEMICAL-VAPOR-DEPOSITIONCHAO, TS; LEE, CL; LEI, TF; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
15-Aug-1992CHARACTERIZATION OF ULTRATHIN OXIDE PREPARED BY LOW-TEMPERATURE WAFER LOADING AND NITROGEN PREANNEALING BEFORE OXIDATIONWU, SL; LEE, CL; LEI, TF; LIANG, MS; 電子工程學系及電子研究所; 電控工程研究所; Department of Electronics Engineering and Institute of Electronics; Institute of Electrical and Control Engineering
7-Dec-1989CIRCUIT EXAMPLE TO DEMONSTRATE THAT FAN-OUT STEMS OF PRIMARY INPUTS MUST BE CHECKPOINTSCHEN, JE; LEE, CL; SHEN, WZ; 交大名義發表; 電控工程研究所; National Chiao Tung University; Institute of Electrical and Control Engineering
1-Jun-1994CMOS THRESHOLD GATE AND NETWORKS FOR ORDER STATISTIC FILTERINGLEE, CL; JEN, CW; 電控工程研究所; Institute of Electrical and Control Engineering
1-Oct-1994THE COMBINED EFFECTS OF LOW-PRESSURE NH3-ANNEALING AND H-2 PLASMA HYDROGENATION ON POLYSILICON THIN-FILM TRANSISTORSYANG, CK; LEI, TF; LEE, CL; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-Mar-1994A COMPLEMENT-BASED FAST ALGORITHM TO GENERATE UNIVERSAL TEST SETS FOR MULTIOUTPUT FUNCTIONSCHEN, BY; LEE, CL; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1994COMPLETE TEST SET FOR MULTIPLE-VALUED LOGIC-NETWORKSWANG, HM; LEE, CL; CHEN, JE; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-Mar-1994CORRELATION OF POLYSILICON THIN-FILM-TRANSISTOR CHARACTERISTICS TO DEFECT STATES VIA THERMAL ANNEALINGCHERN, HN; LEE, CL; LEI, TF; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1981DEPLETION WIDTHS OF THE METAL-INSULATOR SEMICONDUCTOR (MIS) STRUCTUREJEN, CW; LEE, CL; LEI, TF; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-Jul-1995DISTRIBUTED FAULT SIMULATION FOR SEQUENTIAL-CIRCUITS BY PATTERN PARTITIONINGWU, WC; LEE, CL; CHEN, JE; LIN, WY; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-Jul-1995A DOUBLE METAL STRUCTURE PT/AL/N-INP DIODEHUANG, WC; LEI, TF; LEE, CL; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1980A DOUBLE POLE, DOUBLE THROW ELECTRO-OPTIC SWITCH WITH AN N-TYPE ELECTRODELEE, CL; HUANG, JY; 交大名義發表; 電控工程研究所; National Chiao Tung University; Institute of Electrical and Control Engineering
1-May-1994THE EFFECTS OF FLUORINE PASSIVATION ON POLYSILICON THIN-FILM TRANSISTORSCHERN, HN; LEE, CL; LEI, TF; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-Dec-1993THE EFFECTS OF H-2-O-2-PLASMA TREATMENT ON THE CHARACTERISTICS OF POLYSILICON THIN-FILM TRANSISTORSCHERN, HN; LEE, CL; LEI, TF; 電子工程學系及電子研究所; 奈米中心; 次微米人才培訓中心; Department of Electronics Engineering and Institute of Electronics; Nano Facility Center; CTR SUBMICRON PROFESS TRAINING
1-Jun-1989EFFECTS OF HEAT-TREATMENT AND ION DOPING OF INDIUM OXIDELEE, CH; KUO, CV; LEE, CL; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics