Browsing by Author Huang, Rei-Fu

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Showing results 3 to 8 of 8 < previous 
Issue DateTitleAuthor(s)
1-Mar-2013Fault Models and Test Methods for Subthreshold SRAMsLin, Chen-Wei; Chen, Hung-Hsin; Yang, Hao-Yu; Huang, Chin-Yuan; Chao, Mango C. -T.; Huang, Rei-Fu; 交大名義發表; 電子工程學系及電子研究所; National Chiao Tung University; Department of Electronics Engineering and Institute of Electronics
2009Fault Models for Embedded-DRAM MacrosChao, Mango C. -T.; Yang, Hao-Yu; Huang, Rei-Fu; Lin, Shih-Chin; Chin, Ching-Yu; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-Sep-2012Testing Methodology of Embedded DRAMsYang, Hao-Yu; Chang, Chi-Min; Chao, Mango C. -T.; Huang, Rei-Fu; Lin, Shih-Chin; 交大名義發表; 電子工程學系及電子研究所; National Chiao Tung University; Department of Electronics Engineering and Institute of Electronics
2008Testing Methodology of Embedded DRAMsChang, Chi-Min; Chao, Mango C. -T.; Huang, Rei-Fu; Chen, Ding-Yuan; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2014Testing Methods for a Write-Assist Disturbance-Free Dual-Port SRAMYang, Hao-Yu; Lin, Chen-Wei; Huang, Chao-Ying; Lu, Ching-Ho; Lai, Chen-An; Chao, Mango C. -T.; Huang, Rei-Fu; 交大名義發表; 電子工程學系及電子研究所; National Chiao Tung University; Department of Electronics Engineering and Institute of Electronics
2015Testing Methods for Quaternary Content Addressable Memory Using Charge-Sharing Sensing SchemeYang, Hao-Yu; Huang, Rei-Fu; Su, Chin-Lung; Lin, Kuan-Hong; Shu, Hang-Kaung; Peng, Chi-Wei; Chao, Mango C. -T.; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics