Browsing by Author Guo, JC

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Showing results 3 to 12 of 12 < previous 
Issue DateTitleAuthor(s)
1-Dec-20040.13-mu m RF CMOS and varactors performance optimization by multiple gate layoutsHo, CC; Kuo, CW; Chan, Y; Lien, WY; Guo, JC; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-Mar-2006A broadband and scalable model for on-chip inductors incorporating substrate and conductor loss effectsGuo, JC; Tan, TY; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2005A broadband and scalable model for on-chip inductors incorporating substrate and conductor loss effectsGuo, JC; Tan, TY; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1995Direct observation of the lateral nonuniform channel doping profile in submicron MOSFET's from an anomalous charge pumping measurement resultsChung, SS; Cheng, SM; Lee, GH; Guo, JC; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2005A lossy substrate model for sub-100nm, super-100 GHz f(T) RF CMOS noise extraction and modelingGuo, JC; Lin, YM; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2005Low-power and high-linearity mixer design using complex transconductance equivalent circuitZhan, WC; Kuo, CN; Guo, JC; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1996Mechanisms and characteristics of oxide charge detrapping in n-MOSFET'sWang, TH; Chang, TE; Chiang, LP; Huang, CM; Guo, JC; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-Feb-2006A new lossy substrate de-embedding method for sub-100 nm RF CMOS noise extraction and modelingGuo, JC; Lin, YM; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-Aug-2004Pocket implantation effect on drain current flicker noise in analog nMOSFET devicesWu, JW; Cheng, CC; Chiu, KL; Guo, JC; Lien, WY; Chang, CS; Huang, GW; Wang, TH; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2004A simple transmission line de-embedding method for accurate RF CMOS noise modelingGuo, JC; Huang, CH; Lien, WY; Wu, CM; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics