Browsing by Author Chen, LP

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Showing results 21 to 27 of 27 < previous 
Issue DateTitleAuthor(s)
1-Mar-2001The reaction of Co and Si1-xGex for MOSFET with poly-Si1-xGex gateChen, KM; Huang, HJ; Chang, CY; Huang, TY; Huang, GW; Chen, LP; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-Sep-2000Reduction of source/drain series resistance and its impact on device performance for PMOS transistors with raised Si1-xGex source/drainHuang, HJ; Chen, KM; Chang, CY; Chen, LP; Huang, GW; Huang, TY; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-Feb-1997Resist-related damage on ultrathin gate oxide during plasma ashingChien, CH; Chang, CY; Lin, HC; Chang, TF; Chiou, SG; Chen, LP; Huang, TY; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-Feb-1997Resist-related damage on ultrathin gate oxide during plasma ashingChien, CH; Chang, CY; Lin, HC; Chang, TF; Chiou, SG; Chen, LP; Huang, TY; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
8-Jan-1996Studies on damage removing efficiency of B-11(+) and BF2+ implanted Si0.84Ge0.16 epilayers by rapid thermal annealingChen, LP; Chou, TC; Chien, CH; Chang, CY; 電控工程研究所; Institute of Electrical and Control Engineering
1-Jul-2000Study of boron effects on the reaction of Co and Si1-xGex at various temperaturesHuang, HJ; Chen, KM; Chang, CY; Huang, TY; Chang, TC; Chen, LP; Huang, GW; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
15-Aug-2000Study on Ge/Si ratio, silicidation, and strain relaxation of high temperature sputtered Co/Si1-xGex structuresHuang, HJ; Chen, KM; Chang, CY; Huang, TY; Chen, LP; Huang, GW; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics