Browsing by Author Chang, C. T.

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Showing results 3 to 9 of 9 < previous 
Issue DateTitleAuthor(s)
1-Jan-2010Improved Field Emission Characteristics with different Electrode Materials by forming process in a Quasi-planar Thin Film Field Emission DiodeChang, C. T.; Hsu, Y. Y.; Lin, K. C.; Tsai, Wan-Lin; Chien, Yun-Shan; Juan, C. P.; Lee, I. C.; Yang, P. Y.; Cheng, H. C.; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2012Improving TDDB Reliability in Cu Damascene by modulating ESL StructureChang, C. T.; Chang, H. L.; 材料科學與工程學系; Department of Materials Science and Engineering
26-Jul-2010The influences of surface treatment and gas annealing conditions on the inversion behaviors of the atomic-layer-deposition Al(2)O(3)/n-In(0.53)Ga(0.47)As metal-oxide-semiconductor capacitorTrinh, H. D.; Chang, E. Y.; Wu, P. W.; Wong, Y. Y.; Chang, C. T.; Hsieh, Y. F.; Yu, C. C.; Nguyen, H. Q.; Lin, Y. C.; Lin, K. L.; Hudait, M. K.; 材料科學與工程學系; Department of Materials Science and Engineering
26-Jul-2010The influences of surface treatment and gas annealing conditions on the inversion behaviors of the atomic-layer-deposition Al2O3/n-In0.53Ga0.47As metal-oxide-semiconductor capacitorTrinh, H. D.; Chang, E. Y.; Wu, P. W.; Wong, Y. Y.; Chang, C. T.; Hsieh, Y. F.; Yu, C. C.; Nguyen, H. Q.; Lin, Y. C.; Lin, K. L.; Hudait, M. K.; 材料科學與工程學系; Department of Materials Science and Engineering
2015Nanostructured Material Formation for Beyond Si DevicesChang, H. L.; Chang, C. T.; Kuo, C. T.; 材料科學與工程學系; Department of Materials Science and Engineering
2013Study of Conduction Modes of Time to Dielectric Breakdown Reliability in Cu Damascene StructuresChang, H. L.; Chang, C. T.; Kuo, C. T.; 材料科學與工程學系; Department of Materials Science and Engineering
2009UV photodetectors with lateral self-assembled ZnO nanowires grown at low temperatureYang, P. Y.; Lee, I. C.; Chang, C. T.; Lin, K. C.; Wang, J. L.; Cheng, K. J.; Lin, C. C.; Cheng, H. C.; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics